Fritsch Analysette 22 NeXT Nano meetunit 0,01 - 3800 µm

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Automatic particle size analysis down to the nano-range: unbeatably simple and affordable

The completely revised ANALYSETTE 22 NeXT Nano with an extra wide measuring range of 0.01 – 3800 μm for maximum precision and sensitivity for smallest particles with an additional detector system. The intelligently revised measurement design makes the ANALYSETTE 22 NeXT especially compact and space saving. The measuring time is for most measurements less than a minute – including a reliably residue-free cleaning. The complete evaluation of the particle size analysis takes place automatically with clearly organised results visible directly on the screen. Of course, you can also save and print out a report customised to your needs. Get all the decisive advantages with the model that meets your requirements: especially easy operation and cleaning, short analysis times, reliably reproducible results and the recording of additional parameters such as temperature and pH value during wet dispersion.

TYPICAL AREAS OF APPLICATION

The ANALYSETTE 22 NeXT Nano is ideal for especially efficient particle size analysis – in production and quality control as well as in research and development or for controlling manufacturing processes.

RELIABLE MEASURING RESULTS - Certified reproducibility

The ISO 13320 (Particle size analysis – Laser diffraction methods) defines as a guideline the minimum standards for Laser Particle Sizers regarding repeatability, reproducibility and measuring precision and thus regulates the verification of the measuring results. The FRITSCH ANALYSETTE 22 NeXT clearly surpasses the requirements of the ISO 13320.

FEATURES

• Measurement of the particle size in an extra wide measuring range of 0.01 - 3800 µm
• Short measuring times, especially high measuring accuracy
• Consistent reproducibility, reliable comparability
• Solid and low-maintenance with few moving parts
• Easy operation, quick and residue-free cleaning
• Recording of temperature and ph value
• One laser - faster measurement
• Quick and simultaneous recording of all scattering data
• Extremely enlarged measuring angle
• Continuous logging of the laser output
• Quick, automatic beam adjustment
• Fully automatic analysis
• Compact, space-saving design
• Surpasses the requirements of the ISO 13320
• Outstanding support
• Extensive accessories for simplifying your daily work